Photonic Integrated Circuits
PIC-based component testing
- IL and RL or IL and PDL characterization of OSA20 for active component testing: key parameters such as central wavelength, SMSR and OSNR
- CTP10 for passive component testing: IL, RL, PDL , incl. AWG or ring resonators in less than 5 sec.Â
- High dynamic range measurement in a single scan, ensuring fast and reliable results
- New solution including OPAL probe station for single-die and wafer
- Consistent measurements using the same test instruments throughout all the manufacturing stage (including power detection for fiber alignment)
