• Active and passive component measurement
• Characterization of thousands of components per wafer  
• Multivendor and complex test stations
• Testing at different stages: wafer level, die level, packaging, quality assurance

Challenge

OSA20 & CTP10

• Active and passive optical component testing
• Swept optical testing provides fast acquisition with picometer resolution and accuracy
• Full remote control via SCPI commands
• Wafer-level and final testing after packaging

Solution

• OSA20 for transceiver testing: measurement of key parameters such as central wavelength, SMSR and OSNR
• CTP10 for passive component testing: IL, RL, PDL , incl. AWG or ring resonators in less than 5 sec.
• High dynamic range measurement in a single scan, ensuring fast and reliable results
• Proven integrations with several probe station manufacturers
• Consistent measurements using the same test instruments throughout all the manufacturing stages

Results

CTP10 analysis results